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Radiation Hardness and Life Time Studies of LEDs and VCSELs

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A first life time test of neutron irradiated LEDs

In order to check if there is a large effect of irradiation on the life time of LEDs, we irradiated in a first life time test a small number of GaAlAs LEDs (manufactured by ABB Hafo) with up to 1.4*10¹⁴ n/cm² at the RAL ISIS facility. After the irradiation, an almost complete annealing of the radiation damage was observed under forward bias. Five LEDs were subsequently operated in an accelerated life time test without seeing any degradation due to aging for a duration which corresponds to about 57 years of operation in the ATLAS SCT.

For further information see:

	J. Beringer et al., A Life Time Test of Neutron Irradiated Light Emitting Diodes , ATLAS Internal Note, INDET-NO-105 (1995), also available as preprint BUHE-95-4 (1995)
	J. Beringer et al, A Life Time Test of Neutron Irradiated Light Emitting Diodes , Proceedings of the First Workshop on Electronics for LHC Experiments (Lisbon, Spain, 1995), CERN/LHCC/95-56 (1995), p. 167
	J. Beringer et al., A Life Time Test of Neutron Irradiated Light Emitting Diodes , Nucl. Instr. and Meth. A373 (1996) 320
	J. Beringer, Studies for the Inner Detector of the ATLAS Experiment at the Large Hadron Collider , PhD Thesis, University of Bern (1996)

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Last Updated: 24/6/98

E-Mail Address: remigius.mommsen@cern.ch

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